Publication

  • J. Murata, A. Kubota, K. Yagi, Y. Sano, H. Hara, K. Arima, T. Okamoto, H. Mimura, K. Yamauchi
    Chemical planarization of GaN using hydroxyl radicals generated on a catalyst plate in H2O2 solution
    Journal of Crstal Growth, 310 (2008) 1637-1641

  • H. Jiang, D. Ramunno-Johnson, C. Song, H. Wang, B. Amirbekian, Y. Kohmura, Y. Nishino, Y. Takahashi, T. Ishikawa, Lila Graham, M. J. Glimcher, J. Miao
    Nanoscale imaging of mineral crystals inside biological composite materials using x-ray diffraction microscopy
    Physical Review Letters, 100 (2008) 038103

  • S. Matsuyama, H. Mimura, K. Katagishi, H. Yumoto, S. Handa, M. Fujii, Y. Sano, M. Shimura, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi
    Trace element mapping using a high-resolution scanning X-ray fluorescence microscope equipped with a Kirkpatrick-Baez mirror system
    Surfece and Interface Analysis, 40 (2008) 1042-1045

  • H. Mimura, H. Yumoto,S. Matsuyama, S. Handa, T. Kimura, Y. Sano, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi
    Direct Determination of the Wave Field of an X-ray Nanobeam
    Physical Review A, 77 (2008) 015812

  • M. Kanaoka, C, Liu, K. Nomura, M. Ando, H. Takino, Y. Fukuda, Y. Mori, H. Mimura, and K. Yamauchi
    Processing efficiency of elastic emission machining for low-thermal-expansion material
    Surface and Interface Analysis, 40 (2008) 1002-1006

  • Y. Sano, T. Masuda, H. Mimura, and K. Yamauchi
    Ultraprecision finishing technique by numerically controlled sacrificial oxidation
    Journal of Crystal Growth, 310 (2008) 2173-2177

  • H. Mimura, S. Morita, T. Kimura, D. Yamakawa, W. Lin, Y. Uehara, S. Matsuyama, H. Yumoto, H. Ohashi, K. Tamasaku, Y. Nishino, M. Yabashi, T. Ishikawa, H. Ohmori, and K. Yamauchi
    Focusing mirror for x-ray free-electron lasers
    Review of Scientific Instruments, 79 (2008) 083104
    Press release (Japanese)

  • Y. Takahashi, H. Furukawa, H. Kubo, K. Yamauchi, Y. Nishino, T. Ishikawa, and E. Matsubara
    Coherent x-ray diffraction measurements of Cu thin lines
    Surface and Interface Analysis, 40 (2008) 1046-1049

  • Y. Takahashi, H. Kubo, H. Furukawa, K. Yamauchi, E. Matsubara, T. Ishikawa, and Y. Nishino
    Element-specific hard-x-ray diffraction microscopy
    Physical Review B, 78 (2008) 092105

  • S. Handa, H. Mimura, H. Yumoto, T. Kimura, S. Matsuyama, Y. Sano, and K. Yamauchi
    Highly accurate differential deposition for X-ray reflective optics
    Surface and Interface Analysis, 40 (2008) 1019-1022

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