Publication
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A. Kubota, K. Yagi, J. Murata, H. Yasui, S. Miyamoto, H. Hara, Y. Sano and K. Yamauchi
A Study on a Surface Preparation Method for Single-Crystal SiC Using an Fe Catalyst
Journal of ELECTRONIC MATERIALS 38 (2009) 159
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J. Murata, A. Kubota, K. Yagi, Y. Sano, H. Hara, K. Arima, T. Okamoto, H. Mimura, and K. Yamauchi
New chemical planarization of SiC and GaN using an Fe plate in H2O2 solution
Materials Science Forum Vols. 600-603 (2009) pp 815-818
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T. Okamoto, Y. Sano, H. Hara, K. Arima, K. Yagi, J. Murata, H. Mimura and K. Yamauchi
Damage-free Planarization of 2-inch 4H-SiC Wafer Using Pt Catalyst Plate and HF Solution
Materials Science Forum Vols. 600-603 (2009) pp 835-838
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T. Kato, Y. Sano, H. Hara, H. Mimura, K. Yamamura, and K. Yamauchi
Beveling of Silicon Carbide Wafer by Plasma Chemical Vaporization Machining
Materials Science Forum Vols. 600-603 (2009) pp 843-846
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Y. Sano, M. Watanabe, T. Kato, K. Yamamura, H. Mimura, and K. Yamauchi
Temperature Dependence of Plasma Chemical Vaporization Machining of Silicon and Silicon Carbide
Materials Science Forum Vols. 600-603 (2009) pp 847-850
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S. Matsuyama, M. Shimura, H. Mimura, M. Fujii, H. Yumoto, Y. Sano, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa and K. Yamauchi
Trace element mapping of a single cell using a hard x-ray nanobeam focused by a Kirkpatrick-Baez mirror system
X-ray Spectrometry 38, 89-94, (2009).
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Y. Nishino, Y. Takahashi, N. Imamoto, T. Ishikawa, K. Maeshima
Three-dimensional visualisation of a human chromosome using coherent x-ray diffraction
Physical Review Letters 102 (2009) 018101
Press release (Japanese)
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藤原宏樹，山内和人
円筒ころ軸受における対数クラウニングの公差設計
日本機械学会論文集，75C(2009)，1-7
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H. Hara, Y. Morikawa, Y. Sano, and K. Yamauchi
Termination dependence of surface stacking at 4H-SiC(0001)-1×1: Density functional theory calculations
Phys. Rev. B 79, 153306 (2009)
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Y. Takahashi, Y. Nishino, H. Mimura, R. Tsutsumi, H. Kubo, T. Ishikawa, and K. Yamauchi
Feasibility study of high-resolution coherent diffraction microscopy using synchrotron x rays focused by Kirkpatrick-Baez mirrors
Journal of Applied Physics 105 (2009) 083106
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S. Handa, H. Mimura, H. Yumoto, T. Kimura, S. Matsuyama, Y. Sano, K. Yamamura, K. Tamasaku, Y. Nishino, M. Yabashi, T. Ishikawa, and K. Yamauchi
Novel Scheme of Figure-Error Correction for X-ray Nanofocusing Mirror
Japanese Journal of Applied Physics 48 (2009) 096507
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T. Kimura, S. Handa, H. Mimura, H. Yumoto, D. Yamakawa, S. Matsuyama, Y. Sano, K. Inagaki, K. Tamasaku, Y. Nishino, M. Yabashi, T. Ishikawa, and K. Yamauchi
Wavefront Control System for Phase Compensation in Hard X-ray Optics
Jpn. J. Appl. Phys. 48 (2009) 072503
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Y. Takahashi, Y. Nishino, H. Furukawa, H. Kubo, K. Yamauchi, T. Ishikawa, E. Matsubara
Observation of electromigration voids in a Cu thin line by in situ coherent x-ray diffraction microscopy
Journal of Applied Physics 105 (2009) 124911
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Y. Takahashi, Y. Nishino, R. Tsutsumi, H. Kubo, H. Furukawa, H. Mimura, S. Matsuyama, N. Zettsu, E. Matsubara, T. Ishikawa, K. Yamauchi
High-Resolution Diffraction Microscopy Using the Plane-Wave Field of a Nearly Diffraction-Limited Focusing X ray
Physical Review B 80 (2009) 054103
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Y. Takahashi, H. Kubo, H. Furukawa, K. Yamauchi, E. Matsubara, T. Ishikawa, Y. Nishino
Development of incident x-ray flux monitor for coherent x-ray diffraction microscopy
Journal of Physics: Conference Series 186 (2009) 12060
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Y. Nishino, Y. Takahashi, H. Kubo, H. Furukawa, K. Yamauchi, N. Imamoto, R. Hirohata, E. Matsubara, and T. Ishikawa
Nanostructure analysis by coherent hard X-ray diffraction
Journal of Physics: Conference Series 186 (2009) 12056
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藤原宏樹，辻本崇，山内和人
円すいころ軸受ころ大端面の最適曲率半径
日本機械学会論文集，75C (2009)，225
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J. Murata, S. Sadakuni, K. Yagi, Y. Sano, T. Okamoto, K. Arima, A. N. Hattori, H. Mimura, and K. Yamauchi
Planarization of GaN(0001) Surface by Photo-Electrochemical Method with Solid Acidic or Basic Catalyst
Japanese Journal of Applied Physics 48 (2009) 121001
