International Conference

  • J. Yamada (Invited)
    "Ultraintense 7 nm focusing of hard X-ray free-electron laser at SACLA"
    SPIE Optics+Optoelectronics X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VII (8-10 April 2025, Clarion Congress Hotel Prague, Prague, Czech Republic)

  • M. Miyake, S. Matsumura, I. Ogasahara, T. Osaka, J. Yamada, D. Toh, K. Yamauchi, M. Yabashi and Y. Sano
    "Development of an etching technique using atmospheric pressure plasma to realize a distortion-free Ge channel-cut crystal monochromator"
    The 10th International Conference on X-ray Optics and Applications (XOPT2025), Oral, 8-01 (22-24 April 2025, Pacifico Yokohama, Yokohama, Japan)

  • K. Takemura, J. Yamada, A. Yakushigawa, K. Shioi, G. Yamaguchi, D. Toh, Y. Sano and M. Yabashi
    "X-ray nanobeam scanner for high-resolution ptychography using Advanced KB mirror and Risley Prism"
    The 10th International Conference on X-ray Optics and Applications (XOPT2025), Poster, p-05 (22-24 April 2025, Pacifico Yokohama, Yokohama, Japan)

  • A. Iwano, J. Yamada, K. Shioi, G. Yamaguchi, D. Toh, Y. Sano and M. Yabashi
    "Development of X-ray two-color multilayer for XFEL nanofocusing mirrors "
    The 10th International Conference on X-ray Optics and Applications (XOPT2025), Poster, p-14 (22-24 April 2025, Pacifico Yokohama, Yokohama, Japan)

  • R. Oda, M. Miyake, S. Matsumura, T. Osaka, M. Yabashi, K. Yamauchi, J. Yamada, D. Toh and Y. Sano
    "Surface finishing of a micro channel-cut crystal monochromator for self-seeding using high-pressure plasma etching "
    The 10th International Conference on X-ray Optics and Applications (XOPT2025), Poster, p-16 (22-24 April 2025, Pacifico Yokohama, Yokohama, Japan)

  • A. Nagamatsu, J. Yamada, A. Yakushigawa, A. Takeuchi, K. Uesugi, D. Toh, M. Yabashi, K. Yamauchi and Y. Sano
    "Development of scanning-imaging X-ray microscope using advanced Kirkpatrick-Baez mirror"
    The 10th International Conference on X-ray Optics and Applications (XOPT2025), Poster, XOPTp-28 (22-24 April 2025, Pacifico Yokohama, Yokohama, Japan)

  • T. Fukagawa, K. Kayao, D. Toh, J. Yamada, M. Imanishi, S. Washida, S. Usami, Y. Mori and Y. Sano
    "Fabricating Damage-Free Surface for Crystal Growth on Seed GaN Crystal Grown by Na-flux Method Using PEC Etching with Bias Voltage Application"
    The 15th International Conference on Nitride Semiconductors (ICNS-15), Poster, GR-Mon-P5 (06-11 July 2025, Clarion Hotel & Congress Malmö Live, Malmö, Sweden)

  • K. Kayao, T. Fukagawa, D. Toh, J. Yamada, S. Usami, M. Imanishi, Y. Mori and Y. Sano
    "Preparation of Highly Smooth Surfaces on OVPE-GaN Substrates via Photoelectrochemical Reaction-Assisted Polishing"
    The 15th International Conference on Nitride Semiconductors (ICNS-15), Poster, GR-Th-P18 (06-11 July 2025, Clarion Hotel & Congress Malmö Live, Malmö, Sweden)

  • J. Yamada (Invited)
    "X-ray imaging/microscopy developments using advanced Kirkpatrick?Baez mirrors"
    SPIE Optics+Photonics, Optical Engineering, X-Ray Nanoimaging: Instruments and Methods VII, Oral, PC13622-16 (05-06 August 2025, San Diego Convention Center, San Diego CA, US)

  • K. Hanada, J. Yamada, S. Matsuzaka, H. Nakamori, D. Toh, Y. Sano, K. Yamauchi and M. Kanaoka
    "Simulation study for geometric aberrations of advanced KB mirrors for EUV-FEL nanofocusing"
    SPIE Optics+Photonics, Optical Engineering, X-Ray Nanoimaging: Instruments and Methods VII, Poster, 13620-43 (05-06 August 2025, San Diego Convention Center, San Diego CA, US)

  • K. Hanada, J. Yamada, S. Matsuzaka, H. Nakamori, D. Toh, Y. Sano, K. Yamauchi and M. Kanaoka
    "EUV-FEL nanofocusing mirror optics: two-dimensional aberrations of KB and AKB optics"
    Photon Diag 2025, Oral, N/A (02-04 September 2025, Liverpool Guild of Students, Liverpool, UK)

  • Y. Matsumura
    "Damage-free Dicing of SiC Substrate Using High-Pressure SF6 Plasma: – The Time Dependence of Processed Groove Profiles –"
    The 22nd International conference on Silicon Carbide and Related Materials (ICSCRM2025), Poster, P44-303 (14-19 September 2025, BEXCO, Busan, Korea)